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Nitrogen Gas Field Ion Source (GFIS) Focused Ion Beam (FIB) Secondary Electron Imaging: A First Look
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 10 May 2017, pp. 758-768
- Print publication:
- August 2017
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- Article
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Influence of Silicon Doping on the SA-MOVPE of InAs Nanowires
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1258 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1258-P02-05
- Print publication:
- 2010
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- Article
- Export citation